APA (7. basım) Alıntı

Não informado. (2001). IEEE Transactions on Device and Materials Reliability. Institute of Electrical and Electronics Engineers.

Chicago Style (17. basım) Atıf

Não informado. IEEE Transactions on Device and Materials Reliability. New York: Institute of Electrical and Electronics Engineers, 2001.

MLA (8th ed.) Atıf

Não informado. IEEE Transactions on Device and Materials Reliability. Institute of Electrical and Electronics Engineers, 2001.

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