Não informado. (2001). IEEE Transactions on Device and Materials Reliability. Institute of Electrical and Electronics Engineers.
Chicago-viite (17. p.)Não informado. IEEE Transactions on Device and Materials Reliability. New York: Institute of Electrical and Electronics Engineers, 2001.
MLA-viite (8. p.)Não informado. IEEE Transactions on Device and Materials Reliability. Institute of Electrical and Electronics Engineers, 2001.
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