Não informado. (2001). IEEE Transactions on Device and Materials Reliability. Institute of Electrical and Electronics Engineers.
Cita Chicago Style (17a ed.)Não informado. IEEE Transactions on Device and Materials Reliability. New York: Institute of Electrical and Electronics Engineers, 2001.
Cita MLA (8a ed.)Não informado. IEEE Transactions on Device and Materials Reliability. Institute of Electrical and Electronics Engineers, 2001.
Precaución: Estas citas no son 100% exactas.