APA-viite (7. p.)

Não informado. (1990). Journal of electronic testing: Theory and applications. Kluwer Academic Publishers.

Chicago-viite (17. p.)

Não informado. Journal of Electronic Testing: Theory and Applications. Boston, Mass: Kluwer Academic Publishers, 1990.

MLA-viite (8. p.)

Não informado. Journal of Electronic Testing: Theory and Applications. Kluwer Academic Publishers, 1990.

Varoitus: Nämä viitteet eivät aina ole täysin luotettavia.